Table 1 Instruments and specifications
Characterization technique | Instrument |
|---|---|
The Fourier transform infrared (FTIR) spectra | BRUKER VERTEX 70 FT-IR spectrophotometer at 400–4500 cm−1 |
The X-ray diffraction(XRD) patterns | XRD Shimadzu lab X6100, Japan |
X-ray photoelectron spectroscopy (XPS) | Thermo Fisher Scientific (UK) supported instrument with X-ray source gun A = X-Ray 002 400um—FG ON (400 µm) |
Scanning electron microscopy (SEM) pictures besides the elemental composition of adsorbent | JSM-IT200 instrument with Energy Dispersive X-ray spectroscopy (EDX) were utilized after doping the sample by ion sputtering coating instrument (JEOL-JFC-1100E) |
The pictures of transmission electron microscopy (TEM) | JEOL-JSM-1400Plus, Japan |
Thermal gravimetric analysis (TGA) | TGA-50-Schimadzu, Japan |
The Brunauer–Emmett–Teller (BET) | BELSORP-mini II, BEL Japan |
The pH measurements | Were adjusted by Adwa PH-meter |
UV–Visible spectrophotometer | UV–Visible 2700 adsorption spectrophotometer |